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Press Release Eikos Awarded NIST Phase I SBIR and License to NIST Invention FRANKLIN, MA (July 1, 2009) - Leader in nanotube dispersions funded to demonstrate scalable length separation of carbon nanotubes. Eikos, Inc was selected by NIST to demonstrate commercially viable large scale, low cost length separation of carbon nanotubes. As part of the award, NIST granted Eikos a research license to U.S. Patent No. 12/122,288, “Centrifugal Length Separation of Carbon Nanotubes.” In this program, Eikos will adopt the NIST invention to separate and isolate large quantities of length sorted carbon nanotubes. Controlling the length distribution is especially important for tailoring properties of nanotube-containing components; nanotube length is correlated with properties like dispersion viscosity, percolation thresholds, film conductivity, optical response, and cellular uptake rate. NIST has been in the process of developing a carbon nanotube Standard Reference Material® (SRM). SRMs are certified by NIST to exhibit well-characterized and consistent composition and properties. These materials may be used to perform instrument calibrations as part of quality assurance, verify accuracy of analytical measurements and build knowledge for the development of new measurement techniques. Eikos’s program, if successful, will help establish a carbon nanotube SRM. "Eikos is delighted to work with NIST to develop commercially viable quantities of length sorted carbon nanotubes," says Eikos CEO, Joseph Piche. "This award confirms that we are leading the field in commercial-scale, high quality carbon nanotube dispersions." Standard Reference Material® is a NIST registered trademark. About Eikos Contact ### |